K. Frohlich et al., Magnetoresistivity in thin La1-xMnO3 films prepared by metal organic chemical vapour deposition, ACT PHYS SL, 48(6), 1998, pp. 727-730
We compare magnetoresistive properties of epitaxial and polycrystalline La1
-xMnO3 films. The difference between these two types of films is explained
in terms of polarized electron scattering on grain boundaries. We suggest t
hat similar mechanism may be responsible for the high field magnetoresistiv
ity near the insulator-metal transition in both types of films.