Josephson junctions of the grain boundary type (bicrystal, step-edge) were
studied from the point of view of de and rf properties. Temperature and mag
netic field dependences of the critical current density are strongly affect
ed by the YBa2Cu3O7-x, thin film morphology and tunneling current homogenei
ty, and high frequency properties by the order parameter depression at the
boundary interface. In the case of bicrystal junctions the measured de and
rf characteristics follow ideally the dependences calculated using the RSJ
model with finite capacitance. The step-edge junctions had suffered under i
nterface inhomogeneities and grain boudary defects, strongly degrading the
weak link properties.