High critical temperature grain boundary Josephson junctions

Citation
S. Benacka et al., High critical temperature grain boundary Josephson junctions, ACT PHYS SL, 48(6), 1998, pp. 785-788
Citations number
4
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SLOVACA
ISSN journal
03230465 → ACNP
Volume
48
Issue
6
Year of publication
1998
Pages
785 - 788
Database
ISI
SICI code
0323-0465(199812)48:6<785:HCTGBJ>2.0.ZU;2-N
Abstract
Josephson junctions of the grain boundary type (bicrystal, step-edge) were studied from the point of view of de and rf properties. Temperature and mag netic field dependences of the critical current density are strongly affect ed by the YBa2Cu3O7-x, thin film morphology and tunneling current homogenei ty, and high frequency properties by the order parameter depression at the boundary interface. In the case of bicrystal junctions the measured de and rf characteristics follow ideally the dependences calculated using the RSJ model with finite capacitance. The step-edge junctions had suffered under i nterface inhomogeneities and grain boudary defects, strongly degrading the weak link properties.