Experiments on the depolarization near-field scanning optical microscope

Citation
C. Adelmann et al., Experiments on the depolarization near-field scanning optical microscope, APPL PHYS L, 74(2), 1999, pp. 179-181
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
2
Year of publication
1999
Pages
179 - 181
Database
ISI
SICI code
0003-6951(19990111)74:2<179:EOTDNS>2.0.ZU;2-U
Abstract
We demonstrate the operation of an apparatus which we call the depolarizati on near-field scanning optical microscope. It delivers subwavelength resolu tion with uncoated optical fiber tips without the need for additional modul ation techniques. We show that-in the near field-the edges perpendicular to the incident optical polarization are imaged. This dependence on the orien tation of the linear polarization as well as the influence of small ellipti cities of the polarization state on the imaging process are measured on a w ell-defined test sample. The transition from near- to far-field imaging as a function of the tip height is demonstrated. The results are in good agree ment with recent theoretical predictions. (C) 1999 American Institute of Ph ysics. [S0003-6951(98)03344-0].