Ferroelectric films with composition gradients normal to the substrate have
recently been reported to exhibit anomalously large polarization offsets w
hen hysteresis loops are driven with an ac voltage and measured using a Saw
yer-Tower (ST) circuit. These offsets have been reported in graded Pb(Zr, T
i)O-3 (over 400 mu C/cm(2)) and graded (Ba, Sr)TiO3 (30 mu C/cm(2)) films.
In this work, it was found that the offset observed in graded Pb(Zr, Ti)O-3
films can be attributed to development of a dc voltage across the ac-volta
ge driven film, rather than a polarization offset. Recognition of this resu
lt reduces these previously reported offset values by a factor of C-s/C-ref
, where C-ref and C-s are the reference and sample capacitances, respective
ly, used in the ST circuit. These dc-voltage offsets still represent a phen
omenon which may lead to novel device applications. (C) 1999 American Insti
tute of Physics. [S0003-6951(99)03002-8].