A simple, reliable technique for making electrical contact to multiwalled carbon nanotubes

A simple method of making reliable electrical contact to multiwalled carbon nanotubes is described. With these contacts, current in the mA range can b e routinely passed through individual multiwalled nanotubes without adverse consequences, thus allowing their resistance to be measured using a common multimeter. The contacts are robust enough to withstand temperature excurs ions between room temperature and 77 K. I(V) data from different multiwalle d nanotubes are presented and analyzed. (C) 1999 American Institute of Phys ics. [S0003-6951(99)04102-9].