EXTENDED TECHNIQUE FOR COMPLEX PERMITTIVITY MEASUREMENT OF DIELECTRICFILMS IN THE MICROWAVE REGION

Authors
THOMAS R DUBE DC
Citation
R. Thomas et Dc. Dube, EXTENDED TECHNIQUE FOR COMPLEX PERMITTIVITY MEASUREMENT OF DIELECTRICFILMS IN THE MICROWAVE REGION, Electronics Letters, 33(3), 1997, pp. 218-220
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
33
Issue
3
Year of publication
1997
Pages
218 - 220
Database
ISI
SICI code
0013-5194(1997)33:3<218:ETFCPM>2.0.ZU;2-C
Abstract
An extended cavity resonance method using the TE10n mode is discussed for measuring complex permittivity of dielectric films and foils of fl exible dimensions nondestructively. Working relations for dielectric p arameters epsilon' and epsilon '' are obtained on extending the validi ty of conventional cavity perturbation technique. Results of measureme nts performed on mylar are presented. The method is suitable for the d etermination of complex permittivity of dielectric thin films.