ELLIPSOMETRIC SPECTRA OF COBALT PHTHALOCYANINE FILMS

The ellipsometric spectra of vacuum sublimed cobalt phthalocyanine (Co Pc) thin films on single-crystal silicon were studied on a new type of scanning photometric ellipsometer in which the analyser and polarizer rotate synchronously. The complex dielectric function and optical con stants of the film have been obtained in the wavelength range 550-800 nm. It has been found that there is a comparatively large absorption r egion at 600-750 nm for the vacuum sublimed CoPc film and the exciton coupling greatly influences its absorption spectrum.