We present an analytical method for determining the heterojunction bipolar
transistors (HBT's) equivalent-circuit elements. Its special feature is tha
t it does not need measurements of test structures nor optimizations. The n
ew algorithm for extracting the intrinsic elements exploits the information
contained in the frequency dependence of the network parameters, This lead
s to a fast algorithm with a unique solution. The method is validated treat
ing GaInP/GaAs HBT's.