Simulation of high-speed interconnects in a multilayered medium in the presence of incident field

Simulation of high-speed circuits and interconnects in the presence of inci dent electromagnetic interference is becoming an important step in the desi gn cycle. An accurate and efficient method for the analysis of incident fie ld coupling to traces in inhomogeneous medium is described. The method is b ased on the application of the physical optics technique. An interconnect c ircuit simulation stamp is derived. This stamp provides an easy link to cur rent simulators and to recently developed model reduction techniques. In ad dition to accounting for the inhomogeneity of the medium, this method provi des significant in computational efficiency improvement over conventional a pproaches.