Analytical model for electrical and thermal transients of self-heating semiconductor devices
Authors
Zhu, Y
Twynam, JK
Yagura, M
Hasegawa, M
Hasegawa, T
Eguchi, Y
Yamada, A
Suematsu, E
Sakuno, K
Sato, H
Hashizume, N
Citation
Y. Zhu et al., Analytical model for electrical and thermal transients of self-heating semiconductor devices, IEEE MICR T, 46(12), 1998, pp. 2258-2263
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
SICI code
0018-9480(199812)46:12<2258:AMFEAT>2.0.ZU;2-#
Abstract
Transients of self-heating semiconductor devices are theoretically investig
ated based on a feedback circuit model, which is composed of three sub-circ
uits describing the isothermal electrical characteristics, thermal impedanc
e, and temperature dependence of the electrical characteristics of the devi
ces, respectively. Analytical expressions of the frequency and transient re
sponses have been derived for both the electrical and thermal characteristi
cs of self-heating devices, yielding accurate methods to extract the therma
l time constant in both the time and frequency domains. The model is verifi
ed by the transient electrical-response measurement of a GaInP/GaAs heteroj
unction bipolar transistor.