Analytical model for electrical and thermal transients of self-heating semiconductor devices

Citation
Y. Zhu et al., Analytical model for electrical and thermal transients of self-heating semiconductor devices, IEEE MICR T, 46(12), 1998, pp. 2258-2263
Citations number
25
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
46
Issue
12
Year of publication
1998
Part
2
Pages
2258 - 2263
Database
ISI
SICI code
0018-9480(199812)46:12<2258:AMFEAT>2.0.ZU;2-#
Abstract
Transients of self-heating semiconductor devices are theoretically investig ated based on a feedback circuit model, which is composed of three sub-circ uits describing the isothermal electrical characteristics, thermal impedanc e, and temperature dependence of the electrical characteristics of the devi ces, respectively. Analytical expressions of the frequency and transient re sponses have been derived for both the electrical and thermal characteristi cs of self-heating devices, yielding accurate methods to extract the therma l time constant in both the time and frequency domains. The model is verifi ed by the transient electrical-response measurement of a GaInP/GaAs heteroj unction bipolar transistor.