FDTD improvement by dielectric subgrid resolution

Citation
G. Marrocco et al., FDTD improvement by dielectric subgrid resolution, IEEE MICR T, 46(12), 1998, pp. 2166-2169
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
46
Issue
12
Year of publication
1998
Part
1
Pages
2166 - 2169
Database
ISI
SICI code
0018-9480(199812)46:12<2166:FIBDSR>2.0.ZU;2-1
Abstract
Material inhomogeneities are taken into account in the standard finite-diff erence time-domain method by staircase modeling of medium boundaries. Resol ution is, therefore, limited by Yee's cell sizes. In this paper, a new sche me is proposed, which improves material resolution without increasing the d emand of computer resources.