Simulation and measurement of X-ray diffraction from single crystals and evaluation of optimized data collection

Citation
A. Sarvestani et al., Simulation and measurement of X-ray diffraction from single crystals and evaluation of optimized data collection, J APPL CRYS, 31, 1998, pp. 899-909
Citations number
15
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
31
Year of publication
1998
Part
6
Pages
899 - 909
Database
ISI
SICI code
0021-8898(199812)31:<899:SAMOXD>2.0.ZU;2-0
Abstract
In the case of macromolecular crystallography, the measurement of diffracte d intensities with monochromatic X-ray radiation is generally performed by the rotation method. A simulation program has been designed and tested by c omparison with experimental data to investigate the various factors that ar e involved in the measurement and to improve collection strategies and tool s, especially when using radiation from a third-generation synchrotron sour ce. This program takes into account the main source and detector parameters in a realistic way, together with the possibility of selecting the sample characteristics. This then allows one both to evaluate the performances of existing experimental setups and to tailor the characteristics of new instr uments, e.g. when designing a new detector or a new source.