This payer analyzes the relationship between process innovation and learnin
g by doing in the semiconductor industry where improvements in manufacturin
g yield are a catalyst for dynamic cost reductions. In contrast to most pre
vious studies of learning by doing, the learning curve is shown here to be
the product of deliberate activities intended to improve yields and reduce
costs, rather than the incidental byproduct of production volume. Since som
e of the knowledge acquired through learning by doing during new process de
velopment is specific to the production environment where the process is de
veloped, some knowledge is effectively lost when a new process is transferr
ed to manufacturing. We find that dedicated process development facilities,
geographic proximity between development and manufacturing facilities, and
the duplication of equipment between development and manufacturing facilit
ies are all significant in improving performance in introducing new technol
ogies. Once in manufacturing, new processes are shown to disrupt the ongoin
g learning activities of existing processes by drawing away scarce engineer
ing resources to "debug" the new processes.