Filament architectures in AC conductors: the influence of intergrowths

Citation
J. Everett et al., Filament architectures in AC conductors: the influence of intergrowths, PHYSICA C, 310(1-4), 1998, pp. 202-207
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
310
Issue
1-4
Year of publication
1998
Pages
202 - 207
Database
ISI
SICI code
0921-4534(199812)310:1-4<202:FAIACT>2.0.ZU;2-K
Abstract
Filament isolation is an extremely important factor in multi-filamentary co nductors, and attempts have been made to achieve this by incorporating a re sistive oxide sheath around individual filaments. However, filament-bridgin g intergrowths have been observed in conductors with and without the resist ive sheath. We present magnetisation results on BSCCO-2223/Ag conductors wi th different filament configurations, and analyse the data taking into acco unt the effects of magnetic coupling between filaments. All samples studied display some degree of filament bridging. (C) 1998 Published by Elsevier S cience B.V. All rights reserved.