Correlated thermal diffuse scattering in low to medium energy electron diffraction: A new structural tool

Citation
T. Abukawa et al., Correlated thermal diffuse scattering in low to medium energy electron diffraction: A new structural tool, PHYS REV L, 82(2), 1999, pp. 335-338
Citations number
15
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
2
Year of publication
1999
Pages
335 - 338
Database
ISI
SICI code
0031-9007(19990111)82:2<335:CTDSIL>2.0.ZU;2-2
Abstract
We have observed simple oscillations in three-dimensional (3D) patterns of electron thermal diffuse scattering (separated from electron-electron energ y loss) measured on a Si(001) surface. We interpret these oscillations as c oherent interference within a small cluster of atoms in which vibrational c orrelation within the nearest neighbors (NN) is dominant. A 3D Patterson fu nction analysis of the oscillation reveals the atomic structure of the Si(0 01) surface consisting of NN pairs including dimers. This finding provides a promising new clue to determine the structures of bulk and the surface of solids.