Dispersion and intrinsic width of image resonances measured by resonant inelastic electron scattering: The alpha phase of Pb/Ge(111)

Citation
L. Petaccia et al., Dispersion and intrinsic width of image resonances measured by resonant inelastic electron scattering: The alpha phase of Pb/Ge(111), PHYS REV L, 82(2), 1999, pp. 386-389
Citations number
15
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
2
Year of publication
1999
Pages
386 - 389
Database
ISI
SICI code
0031-9007(19990111)82:2<386:DAIWOI>2.0.ZU;2-S
Abstract
Evidence of image states on semiconductor surfaces has been very scanty so far. We find that resonant scattering through image resonances totally domi nates the electron energy loss spectra of the alpha phase of Pb/Ge(111) if the energy and the parallel momentum of the scattered electron are in the g ap of the bulk bands projected onto the (1 x 1) surface Brillouin zone. The high energy and momentum resolution obtainable allows a detailed study of the interaction of these excited states with the substrate.