The contribution of vacancies to carbon out-diffusion in silicon

Citation
Rf. Scholz et al., The contribution of vacancies to carbon out-diffusion in silicon, APPL PHYS L, 74(3), 1999, pp. 392-394
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
3
Year of publication
1999
Pages
392 - 394
Database
ISI
SICI code
0003-6951(19990118)74:3<392:TCOVTC>2.0.ZU;2-L
Abstract
Diffusion of carbon is mostly assumed to be governed by carbon interstitial s via the kick-out mechanism. Carbon in-diffusion experiments are associate d with thermal equilibrium concentrations of point defects, whereas in the case of carbon out-diffusion a remarkable undersaturation of Si self-inters titials may develop provided the carbon concentration is several orders of magnitude over its solubility value. New carbon out-diffusion experiments d emonstrate that this model qualitatively describes the observed carbon diff usion profiles. However, we demonstrate that an accurate description of the experimental profiles is only possible if the Frank-Turnbull mechanism, in volving vacancies, is additionally taken into account. Detailed investigati ons of carbon and boron profiles in the same sample can be used to determin e the splitting of the known vacancy component of the silicon self- diffusi on coefficient into the vacancy diffusion coefficient and the vacancy therm al equilibrium concentration at 900 degrees C. (C) 1999 American Institute of Physics. [S0003-6951(99)02202- 0].