Fluorescence is one of the molecular spectroscopic properties that is enhan
ced by placing the molecule on the rough surface of a coinage metal. The su
rface-enhanced fluorescence (SEF) can be directly observed in steady-state
fluorescence experiments, The observations are the results of a delicate ba
lance between the enhanced emission and the quenching due to energy transfe
r to nonradiative surface plasmons, In the present report, SiO2-coated silv
er films were fabricated at varying dielectric thickness. The surface of th
e films was analyzed with the use of atomic force microscopy (AFM) and Xray
photoelectron spectroscopy (XPS), AFM confirms the surface roughness and X
PS analysis indicates that the SiO2 coverage was successful. SEF and SERS (
surface-enhanced Raman scattering) were observed on active 6, 10, and 14 nm
silver films coated with SiO2. Similar results were obtained with a 6 nm s
ilver film coated with 6 nm SiO. The SEF work was carried out on fluorescen
t molecules with different quantum yield, and the typical enhancement facto
r obtained for the fluorescent signal was approximately 10, Both the SiO2 a
nd SiO overlayers provide stable surfaces with well-defined hydrophilic pro
perties, Such stable constructions have applicability towards the advanceme
nt of SERS and SEF as routine analytical techniques in bio- and chemical se
nsors.