J. Krupka et J. Mazierska, Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators, IEEE APPL S, 8(4), 1998, pp. 164-167
Two techniques to minimize the influence of parasitic losses on surface res
istance measurements of superconductors employing dielectric resonators hav
e been described, The first method optimizes the sapphire resonator aspect
ratio to minimize the parasitic losses for given superconductor sample dime
nsions and measurement frequency. The second utilizes a reference resonator
with a perfect conductor plane to cancel out the influence of parasitic lo
sses by measurements of the resonant frequencies and Q-factors of two reson
ators. The second technique is recommended when materials having noticeable
dielectric losses are used to construct dielectric resonators.