Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators

Citation
J. Krupka et J. Mazierska, Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators, IEEE APPL S, 8(4), 1998, pp. 164-167
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
8
Issue
4
Year of publication
1998
Pages
164 - 167
Database
ISI
SICI code
1051-8223(199812)8:4<164:IOAIMO>2.0.ZU;2-L
Abstract
Two techniques to minimize the influence of parasitic losses on surface res istance measurements of superconductors employing dielectric resonators hav e been described, The first method optimizes the sapphire resonator aspect ratio to minimize the parasitic losses for given superconductor sample dime nsions and measurement frequency. The second utilizes a reference resonator with a perfect conductor plane to cancel out the influence of parasitic lo sses by measurements of the resonant frequencies and Q-factors of two reson ators. The second technique is recommended when materials having noticeable dielectric losses are used to construct dielectric resonators.