Circulating power, RF magnetic field, and RF current density of shielded dielectric resonators for power handling analysis of high-temperature superconducting thin films of arbitrary thickness

In the current quest for HTS films with negligible power effects at high RF power levels for wireless communications, accurate calculations of a maxim um RF magnetic field H-max and of a maximum RF current density J(max) flowi ng on the surface of superconducting films is necessary to allow for any se nsible conclusions and comparisons. As the dielectric resonator method is u sed most frequently for investigation of HTS losses, the authors discuss in this paper a dependence of the circulating power and of a maximum RF magne tic field H-max on dielectric resonators' geometry as well as of the maximu m RF current density J(max) flowing on the surface of superconducting films on the films' thickness, for a general case of a resonator shielded in a m etallic cavity, The authors' results demonstrate that under the same input power levels the same HTS films may be exposed to differing RF power level conditions, depending on the cavity to dielectric radius ratio and thicknes s of superconducting films. This means that there may be a significant disc repancy between calculated and real power handling capabilities of HTS film s tested in different dielectric resonators unless correct formulas are use d.