Efficient fault diagnosis of large scale analogue circuits based on symbolic method

In this paper, we present a novel procedure to test and diagnose faults in large scale analogue circuits. Large change sensitivity analysis is used to obtain diagnostic voltages and currents. Decomposition technique is applie d and algorithms for isolation of faulty nodes, faulty connections and faul ty subcircuits are proposed. The hardware overhead problem is considered an d it leads to an optimization of test nodes. The circuit analysis is based on a new symbolic technique which is less costly than traditional methods i n terms of time complexity. One benchmark circuit is performed and the resu lts show the efficiency of this method.