A Ti/Pt/PbTiO3/Au multilayer thin film structure has been deposited onto st
andard telecommunication optical fibers. A reactive magnetron sputter depos
ition technique at high temperature was used to obtain in situ crystallized
PbTiO3 thin films with the perovskite structure. PbTiO3 layers with a cons
tant thickness of about 0.81 +/- 0.05 mu m were obtained over a 5 cm length
of fiber, but both microstructure and phase formation vary widely along th
e fiber length. A dielectric constant of 210 +/- 13 and dielectric loss of
0.07 were measured for the phase pure PbTiO3 coated section of fiber. Varia
tions in the coating properties along the fiber can clearly be related to t
he temperature distribution occurring in the fabrication process.