Combined AFM/XPS study of the failure surfaces in the PVC film/adhesive/glass system

Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) ha ve been used to study the nature of the failure interface and the failure m echanism in a PVC film/adhesive/glass system. By employing the AFM techniqu e, isolated islands of adhesive residues of horizontal dimension of 100-200 nm and 30-50 nm high with less than 20% coverage were observed on the glas s surface after peeling the PVC film from thr glass substrate. Using the XP S technique, the failure mode was found to be mainly interfacial, occurring at the glass/adhesive interface, and also partially cohesive, located in t he adhesive layer very close to the interface. The results are discussed in relation to the chemical nature of the interface and the failure mechanism .