Ak. De et al., Estimation of (OH)-O-center dot radical reaction rate constants for phenoland chlorinated phenols using UV/H2O2 photo-oxidation, J HAZARD M, 64(1), 1999, pp. 91-104
A detailed investigation on UV/H2O2 photooxidation has been carried out in
order to determine the kinetics of the oxidative degradation of phenol and
2- and 4-chlorophenols in dilute aqueous solutions. Effects of different pr
ocess parameters, such as initial substrate and H2O2 concentrations, substr
ate to H2O2 ratio on the degradation kinetics of the phenolic substrates, h
ave been studied. Degradation rates of phenol and chlorophenols are insigni
ficantly small with ultraviolet radiation only and also with hydrogen perox
ide (in the absence of UV radiation), but the synergistic effect of UV/H2O2
results in a marked enhancement of the rates of degradation. A mechanistic
model for UV/H2O2 photooxidation has been developed. Room temperature (27
degrees C) rate constants for the reaction of (OH)-O-. radical (formed by a
bsorption of photons) with the substrates have been estimated by using the
model equation. The calculated rate constants are of the same order of magn
itude as reported for other similar aromatic compounds. (C) 1999 Elsevier S
cience B.V. All rights reserved.