Structure and microtribological mechanism of teflon deposited film

Citation
Jh. Wang et al., Structure and microtribological mechanism of teflon deposited film, J MAT SCI T, 15(1), 1999, pp. 17-20
Citations number
10
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
ISSN journal
10050302 → ACNP
Volume
15
Issue
1
Year of publication
1999
Pages
17 - 20
Database
ISI
SICI code
1005-0302(199901)15:1<17:SAMMOT>2.0.ZU;2-1
Abstract
Teflon film was prepared by ion beam enhanced deposition method. The struct ure and microtribological properties were studied by PHI-5300, FT-IR, XRD a nd atomic force and friction force microscope (AFM/FFM). The results show t hat the deposited Teflon is in crystalline state, and its structure is the same as the bulk Teflon. There are two periods in the friction and wear tes ts for Teflon film. When the load is less than 70 nN, the micro friction fo rce is linear with the load, and the Teflon does not have the lubricity. Bu t when the load is greater than 70 nN, the friction force of Teflon film wi ll stay nearly constant, and worn marks will be created in the friction and wear process. The worn depth of Teflon film increases linearly with the lo ad.