Optical topometry of surfaces with locally changing materials, layers, andcontaminations. Part 1: Topographic methods, based on two-beam interferometry

Citation
K. Leonhardt et Hj. Tiziani, Optical topometry of surfaces with locally changing materials, layers, andcontaminations. Part 1: Topographic methods, based on two-beam interferometry, J MOD OPT, 46(1), 1999, pp. 101-114
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF MODERN OPTICS
ISSN journal
09500340 → ACNP
Volume
46
Issue
1
Year of publication
1999
Pages
101 - 114
Database
ISI
SICI code
0950-0340(19990115)46:1<101:OTOSWL>2.0.ZU;2-7
Abstract
Conventional topometry, applied to surfaces with locally changing materials can result in significant errors in the measured heights. A new theoretica l approach is developed for the case of two-beam interferometry. Applied to some surface structures-gold on glass, oil on steel and SiO2 on Si-importa nt effects of contrast and phase variations are brought to attention. They are explained by a new theory using the complex contrast. Ways for surface correction procedures are outlined.