Molecular beam epitaxial growth and structural properties of Bi1-xSbx alloy thin films on CdTe(III) substrates

Citation
Sl. Cho et al., Molecular beam epitaxial growth and structural properties of Bi1-xSbx alloy thin films on CdTe(III) substrates, J VAC SCI A, 17(1), 1999, pp. 9-13
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
17
Issue
1
Year of publication
1999
Pages
9 - 13
Database
ISI
SICI code
0734-2101(199901/02)17:1<9:MBEGAS>2.0.ZU;2-D
Abstract
We have successfully grown BiSb alloy thin films on CdTe(111)B over a wide range of Sb compositions using molecular beam epitaxy. Structural propertie s have been investigated using in situ reflection high-energy electron diff raction, x-ray diffraction, and atomic force microscopy. Adding Sb to Bi le ads to a reduction of the lattice constant, poorer crystallinity, and a rou gher surface morphology. (C) 1999 American Vacuum Society. [S0734-2101(99)0 4601-1].