Temperature-tunable silicon-wafer etalon for frequency chirp measurements

Authors
Niemi, T Tammela, S Kajava, T Kaivola, M Ludvigsen, H
Citation
T. Niemi et al., Temperature-tunable silicon-wafer etalon for frequency chirp measurements, MICROW OPT, 20(3), 1999, pp. 190-192
Citations number
2
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
20
Issue
3
Year of publication
1999
Pages
190 - 192
Database
ISI
SICI code
0895-2477(19990205)20:3<190:TSEFFC>2.0.ZU;2-4
Abstract
A new device concept for measuring the time-resolved frequency chirp in mod ulated laser diodes is presented. It makes use of ja solid silicon-wafer et alon as an optical frequency discriminator. The transmission properties of the etalon are tuned by controlling the refractive index of silicon by tuni ng the temperature of the etalon. The device allows automated measurements of frequency chirps up to +/-25 GHz in optical telecommunication links with a time resolution of about 20 ps. (C) 1999 John Wiley & Sons, Inc.