Excitonic photoluminescence in 4H-SiC unintentionally doped with nitrogen w
as investigated under hydrostatic pressure up to 5 GPa. The pressure coeffi
cient of Q(0) exciton line was determined to be +2.7 meV/GPa. This value me
asures the pressure coefficient of the indirect gap of 4H-SiC. It compares
very well with the results of theoretical calculations based on local densi
ty functional theory which predicts +2.1 meV/GPa.