S. Onari et al., Optical properties of the amorphous semiconductor (GeS2)(1-x)(Bi2S3)(x) system under high pressure, PHYS ST S-B, 211(1), 1999, pp. 263-267
We measured the change of the absorption spectra under high pressure to stu
dy the optical properties of the amorphous (GeS2)(1-x)(Bi2S3)(x) system, an
d we also studied the change of local atomic structures under pressure with
increasing Bi2S3 concentration. The optical edge exhibits a red shift with
increasing pressure, and depends strongly on the Bi2S3 concentration. Espe
cially for the concentration range x = 0 to 0.05, the optical gap E-o decre
ases non-linearly in the pressure range 2.0 to 4.0 GPa, and large hysteresi
s effects are observed in the GeS2-rich composition. For the concentration
range 0.1 less than or equal to x, the optical gap E-o decreases linearly w
ith pressure, and no hysteresis effects are observed. As the existence of i
nternal void structure is considered to be the origin of the hysteresis, it
is considered that the irreversible destruction of the void structure indu
ces the nonlinear decrease of the optical gap E-o.