High pressure measurements and the "universal" scaling of impact ionization with bandstructure

Citation
J. Allam et Ar. Adams, High pressure measurements and the "universal" scaling of impact ionization with bandstructure, PHYS ST S-B, 211(1), 1999, pp. 335-344
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
211
Issue
1
Year of publication
1999
Pages
335 - 344
Database
ISI
SICI code
0370-1972(199901)211:1<335:HPMAT">2.0.ZU;2-F
Abstract
We have investigated impact ionization in semiconductors under hydrostatic pressure (p), by measuring the avalanche breakdown voltage (V-b) in InAs, S i, GaAs and Ge. The sign of dV(b)/dp was determined by the dominant phonon scattering mechanism (polar or intervalley phonons). A quantitative compari son with simple theories gave information on the location in k-space of sec ondary electrons. Extending the analysis to the determination of V-b in wid e bandgap semiconductors revealed a simple linear relation between V-b and (E), a Brillouin-zone averaged energy gap.