Lateral transport in strained SiGe quantum wells doped with boron

Citation
Ms. Kagan et al., Lateral transport in strained SiGe quantum wells doped with boron, PHYS ST S-B, 211(1), 1999, pp. 495-499
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
211
Issue
1
Year of publication
1999
Pages
495 - 499
Database
ISI
SICI code
0370-1972(199901)211:1<495:LTISSQ>2.0.ZU;2-1
Abstract
The temperature dependence of conductivity and hole mobility in boron doped SiGe quantum well structures was studied. The conductivity at low temperat ures is shown to be due to hopping over neutral B centers while at higher t emperatures, it is due to two-stage excitation including thermal activation of holes from the ground to strain-split B states following by hole tunnel ing into the valence band. Inclining the valence bands of investigated QW s tructures makes possible to find the energy splitting of acceptor levels by strain from the temperature dependence of conductivity.