We report measurements on voltage instability at high flux-flow velocities
in Bi2Sr2CaCu2O8 + delta superconducting films. Current-voltage (I - V) cha
racteristics have been measured as a function of temperature, magnetic fiel
d, and angle between the field and the c axis of the sample. Voltage jumps
were observed in I-V characteristics taken in all magnetic-held directions
and in extended temperature and field ranges. An analysis of the experiment
al data, based on a theory for viscous flux-flow instability with a finite
heat-removal rate from the sample, yielded the inelastic scattering rate an
d the diffusion length of quasiparticles. Reasonable values of the heat-tra
nsfer coefficient from film to bath have been obtained. This theory can als
o successfully explain the observed scaling behavior I*(T,H) = I*(H)(1 - T/
T-co)(3/2) with I*(H) proportional to 1/(1 + H/H-0)(alpha), where T-co, H-0
, and alpha are fitting parameters, determined by the temperature and magne
tic-field dependence of the critical current I* at which the voltage jumps
occur. A two-dimensional scaling for the angular dependence of the critical
current I* and the critical voltage V* associated with the voltage jump ha
s been found and interpreted with a model based on the two-dimensional beha
vior of this system. [S0163-1829(99)10901-9].