Zr-Ce oxide films with compositions from pure Zr oxide to pure Ce oxide wer
e made by reactive DC magnetron co-sputtering. The composition and structur
e were determined by Rutherford backscattering and X-ray diffraction. Pure
Ce oxide films have high charge capacity and are optically passive under ch
arge insertion; they are, however, chemically unstable in an electrolyte of
LiClO4 in propylene carbonate. Pure Zr oxide has practically zero charge c
apacity. Zr-Ce oxide films have high (above 80%) optical transmittance, hig
h charge capacity, and good chemical stability. These films remain fully tr
ansparent irrespective of their degree of lithiation, which may be reconcil
ed with electrons accommodating 4f states of Ce. (C) 1999 Elsevier Science
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