Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation

Authors
de Bernabe, A Capitan, MJ Fischer, HE Quiros, C Prieto, C Colino, J Mompean, F Sanz, JM
Citation
A. De Bernabe et al., Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation, SURF INT AN, 27(1), 1999, pp. 1-7
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
27
Issue
1
Year of publication
1999
Pages
1 - 7
Database
ISI
SICI code
0142-2421(199901)27:1<1:COSAOL>2.0.ZU;2-K
Abstract
The use of resonant low-angle x-ray diffraction, combining specular and off -specular scans, has been used to characterize accurately and self-consiste ntly a set of magnetron-sputtered Co/Cu multilayers. This study has permitt ed their mesoscopic structure and quality of interfaces to be determined. M oreover, it has been observed that oxidation of the outer Co layer stops at the Co/Cu interface, whence no Cu oxide is produced. The cause of this is explained by the difference in the Fermi energies between Co and Cu. (C) 19 99 John Whey & Sons, Ltd.