TEM studies of self-organization phenomena in CdSe fractional monolayers in a ZnSe matrix

The main stages of the intrinsic morphology transformation of MBE and MEE g rown CdSe/ZnSe fractional monolayers (FMs) have been investigated by transm ission electron microscopy (TEM). The FM morphology evolution is studied as a function of the FM nominal thickness in the range of 0.1-2.8 hit. Emerge nce of self-organized extended (15-30 nm) CdSe-based pseudomorphic islands is observed in the plan-view TEM images of FMs with a nominal thickness abo ve 0.7 ML. A comparative analysis of the MEE and MBE grown structures has s hown that in the case of MEE mode the FM morphology is more homogeneous, (C ) 1998 Elsevier Science S.A. All rights reserved.