Allotaxy in the Ni-Si system

Citation
S. Teichert et al., Allotaxy in the Ni-Si system, THIN SOL FI, 336(1-2), 1998, pp. 222-226
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
336
Issue
1-2
Year of publication
1998
Pages
222 - 226
Database
ISI
SICI code
0040-6090(199812)336:1-2<222:AITNS>2.0.ZU;2-I
Abstract
Allotaxy is a special method to grow epitaxial heterostructures. An importa nt role in this process is the distribution of the crystallites of the comp ound AB(X) in the matrix A. This study concerns the first step of allotaxy in the Ni-Si system, that is, the preparation of the precipitate distributi on. To investigate the influence of the deposition conditions on the growth and arrangement of the precipitates the substrate temperature as well as t he deposition rate have been varied. RES measurements revealed the redistri bution of the deposited Ni already during the deposition process resulting in precipitate coarsening. This effect increases with increasing substrate temperature and decreasing deposition rate. A strong diffusion of Ni atoms towards the sample surface has been observed. The TEM analysis shows that o riented cubic NiSi2 is grown. Under appropriate deposition conditions self- assembling of the NiSi2 precipitates has been observed. (C) 1998 Elsevier S cience S.A. All rights reserved.