Theoretical calculations of detection limits in total reflection XRF analysis

Theoretical expressions for fluorescent intensity and scattered radiation i n total reflection experiments are presented. Trace elements in samples wit h different matrices were studied. The contributions of the different compo nents were analyzed and a comparison with conventional g-ray fluorescence w as performed. Detection limits were calculated as a function of the sample thickness in both experimental situations. Very interesting conclusions wer e obtained regarding the contribution of the reflected beam, the components of the background and the behavior of detection levels. Copyright (C) 1999 John Wiley & Sons, Ltd.