T. Tamai, Peculiar patterns of SiO2 contamination on the contact surface of a micro relay operated in a silicone vapor environment, IEICE TR EL, E82C(1), 1999, pp. 81-85
Peculiar patterns of SiO2 contamination around the periphery of the contact
trace caused by silicone vapor under switching at the boundary of 1.6 W we
re confirmed. For micro relays, the electrical power conditions are restric
ted to lower level. Therefore, it is important to ascertain the upper limit
of the electrical power conditions for normal operation. The peculiar patt
ern is important as it is recognized as the first stage of the origination
of contact failure. Causes of this pattern were discussed from the viewpoin
ts of temperature distribution in the contact trace, molten metallic bridge
, micro are discharge, and supply of silicone vapor with oxygen. It is prop
osed that during the closing contacts, as maximum Joule heating occurs at t
he periphery of the true contact area and silicone vapor with oxygen is eas
ily supplied at the periphery, SiO2 grows around the contact trace. For the
opening contacts, as the bridge or micro are appears, silicone vapor with
oxygen is supplied only outside of the contacts. Thus SiO2 is formed mainly
around the periphery of the trace. Moreover, SiO2 was scattered radially d
epending on the sputtering of molten metal under rupture of the bridge. The
refore, the peculiar pattern forms as a result.