We present what we believe is a novel technique based on the moire effect f
or fully diagnosing the beam quality of an x-ray laser. Using Fresnel diffr
action theory, we investigated the intensity profile of the moire pattern w
hen a general paraxial beam illuminates a pair of Ronchi gratings in the qu
asi-far field. Two formulas were derived to determine the beam quality fact
or M-2 and the effective radius of curvature R-e from the moire pattern. On
the basis of the results, the far-field divergence, the waist location, an
d the radius can be calculated further. Finally, we verified the approach b
y use of numerical simulation. (C) 1999 Optical Society of America [S0740-3
232(99)01502-1].