Amorphous carbon nitride (CNx) films have been synthesized by electrochemic
al deposition on positive biased silicon substrates at room temperature. Th
e films adhere well to the Si substrates, but are softer than Si and have m
any cracks. Multiple binding energy values obtained for the C 1s and N 1s p
hotoelectrons in the film suggest that the C and N atoms both exhibit three
chemical states. The Fourier transformation infrared spectroscopy for the
film shows four main bands at 1351 cm(-1), 1660 cm(-1) 2147 cm(-1) and 3220
cm(-1), respectively. The N to C concentration ratio was estimated to be 0
.1. Red color photoluminescence with a peak at similar to 630 nm has been o
bserved in the prepared CNx films. (C) 1999 Elsevier Science B.V. All right
s reserved.