We present experimental evidence of electron-beam-induced diffusion of O an
d H in unintentionally doped n-type GaN grown on a sapphire substrate. Impu
rity diffusion was investigated using cathodoluminescence kinetics and imag
ing at 4 and 300 K and by wavelength dispersive x-ray analysis. The results
illustrate the significance of electron-beam-induced electromigration in w
ide band gap semiconductors, confirm the roles of O-N(.) in bound exciton,
donor-acceptor pair and yellow emissions and suggest the involvement of O-N
(.) and hydrogenated gallium vacancies in the previously unexplained blue l
uminescence. [S0163-1829(99)09403-5].