Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope

An experimental and theoretical study on the nature of the movement of a sc anned tip an a beta-MoTe2 surface is presented, which examines the conseque nces of the applied loading force on the resolution of sub-unit-cell struct ures of a scanning force microscope operated in contact mode. By comparison of experimental and simulated force maps it is found that the so-called "s tick-slip" movement of the tip depends strongly on the applied loading forc e. This effect has significant consequences on the resolution of the examin ed nontrivial unit cell of beta-MoTe2. [S0163-1829(99)00504-4].