Excitonic absorption of GaN epilayers on sapphire: Dynamics, intensity, and temperature dependence

Citation
H. Haag et al., Excitonic absorption of GaN epilayers on sapphire: Dynamics, intensity, and temperature dependence, PHYS REV B, 59(3), 1999, pp. 2254-2260
Citations number
40
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
3
Year of publication
1999
Pages
2254 - 2260
Database
ISI
SICI code
0163-1829(19990115)59:3<2254:EAOGEO>2.0.ZU;2-U
Abstract
Using test-pump measurements, we studied the excitonic absorption of GaN ep ilayers on sapphire substrate under nanosecond and picosecond pulsed excita tion conditions. We measured a short exciton lifetime of 25 ps, which is co nsistent with results obtained from degenerate four-wave mixing measurement s. Since the radiative lifetime should be much longer, this short character istic time shows the dominance of nonradiative processes. Under nonresonant excitation condition, we observed an intensity dependent shift and damping of the exciton resonance, attributed to an inhomogeneous temperature distr ibution. This thermal effect was not observed under resonant excitation con ditions. This behavior is tentatively explained by the presence of shallow centers that have a rather long lifetime and recombine nonradiatively. [S01 63-1829(99)10203-0].