Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas

Citation
Nj. Peacock et al., Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas, REV SCI INS, 70(1), 1999, pp. 317-322
Citations number
17
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
1
Year of publication
1999
Part
2
Pages
317 - 322
Database
ISI
SICI code
0034-6748(199901)70:1<317:VUEUAX>2.0.ZU;2-D
Abstract
An empirical procedure, "LINT," for relating emission line intensities of i ntrinsic impurity ions to their elemental contributions to the total, bolom etric, radiation loss and the volume-averaged effective ion charge, Z(eff), has been developed and applied to limiter plasmas in the JET tokamak. In t his article we discuss extensions to the data base to include x-ray lines a nd continua intensities, applicable to a wider range of tokamak plasma conf igurations such as X-point plasmas and quasi-steady-state, edge-cooled ELMy H modes. Examples are shown of the technique applied to reference discharg es during which the plasma configuration is changed continuously. The total data set, comprising line and continua irradiances, tomographic bolometry, and x-ray emission and Z(eff) imposes constraints on the diffusion paramet ers used in models of impurity ion transport. (C) 1999 American Institute o f Physics. [S0034-6748(99)66301- 8].