Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements

Citation
Ga. Chandler et al., Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements, REV SCI INS, 70(1), 1999, pp. 561-565
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
1
Year of publication
1999
Part
2
Pages
561 - 565
Database
ISI
SICI code
0034-6748(199901)70:1<561:FXDDFO>2.0.ZU;2-9
Abstract
Filtered x-ray diode (XRD) detectors are used as primary radiation flux dia gnostics on Sandia's Z accelerator, which generates nominally a 200-TW, 2-M J, x-ray pulse. Given such flux levels and XRD sensitivities the detectors are being fielded 23 m from the source. The standard diagnostic setup and s ensitivities are discussed. Vitreous carbon photocathodes are being used to reduce the effect of hydrocarbon contamination present in the Z-machine va cuum system. Nevertheless pre- and postcalibration data taken indicate spec trally dependent changes in the sensitivity of these detectors by up to fac tors of 2 or 3. (C) 1999 American Institute of Physics. [S0034-6748(99)7040 1-6].