New electron cyclotron emission diagnostic for measurement of temperature based upon the electron Bernstein wave

Citation
Pc. Efthimion et al., New electron cyclotron emission diagnostic for measurement of temperature based upon the electron Bernstein wave, REV SCI INS, 70(1), 1999, pp. 1018-1020
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
1
Year of publication
1999
Part
2
Pages
1018 - 1020
Database
ISI
SICI code
0034-6748(199901)70:1<1018:NECEDF>2.0.ZU;2-4
Abstract
Most magnetically confined plasma devices cannot take advantage of standard electron cyclotron emission (ECE) diagnostics to measure temperature. They either operate at high density relative to their magnetic field (e.g., ome ga(p)much greater than Omega(c) in spherical tokamaks) or they do not have sufficient density and temperature to reach the blackbody condition (tau > 2). The standard ECE technique measures the electromagnetic waves emanating from the plasma. Here we propose to measure electron Bernstein waves (EBW) to ascertain the local electron temperature in these plasmas. The optical thickness of EBW is extremely high because it is an electrostatic wave with a large k(i). For example, the National Spherical Torus Experiment (NSTX) will have an optical thickness tau approximate to 3000 and CDX-U will have tau approximate to 300. One can reach the blackbody condition with a plasma density approximate to 10(11) cm(-3) and T-e approximate to 1 eV. This mak es it attractive to most plasma devices. The serious issue with using EBW i s the wave accessibility for the emission measurement. Simple accessibility arguments indicate the wave may be accessible by either direct coupling or mode conversion through an extremely narrow layer (approximate to 1-2 mm). EBW experiments on the Current Drive Experiment-Upgrade (CDXU) will test t he accessibility properties of the spherical tokamak configuration. (C) 199 9 American Institute of Physics. [S0034-6748(99)74201-2].