We report on the chemical adsorption of acids and bases on indium tin oxide
(ITO). Ultraviolet photoelectron spectroscopy was used to measure the work
function of the treated ITO and atomic surface concentrations were determi
ned by x-ray photoelectron spectroscopy. The acid treatments yield work-fun
ction shifts as high as 0.7 eV compared to the nontreated ITO. Huge shifts
in the work function are also obtained for the treatments with bases and ar
e opposite to those obtained with the acids. These dramatic shifts are indi
cative of a double ionic surface layer. The importance of an appropriate pl
asma treatment prior to the chemical adsorption of acids or bases is discus
sed in terms of surface acido-basicity. (C) 1999 American Institute of Phys
ics. [S0003-6951(99)00506-9].