By measuring stress and strain that build up in thin films during hydrogen
absorption, the elastic constants of the films can be determined, if a one-
dimensional elastic behavior occurs only. This will be demonstrated for hyd
rogen absorption in Nb films. The in-plane stress is determined from the su
bstrate curvature that is measured by using a two-beam laser setup. The out
-of-plane strain is measured via x-ray diffraction. Furthermore, this metho
d allows us to distinguish whether the film is plastically or elastically d
eformed by checking the reversibility of the stress-strain curve. In the ca
se of a 250-nm-thick Nb film, the elastic constants obtained are similar to
that of bulk Nb. (C) 1999 American Institute of Physics. [S0003-6951(99)00
405-2].