Measurements of residual stresses in micron regions by using synchrotron excited Kossel diffraction

In 1996; we performed the first measurements of residual stresses by using synchrotron excited KOSSEL diffraction (at the beamline L of the HASYLAB, H amburg). Our first findings as well as the principle of the determination p rocedure for obtaining residual stresses from KOSSEL lines are presented. T he KOSSEL technique is a very suitable method for fast measurements of loca l residual stresses in micron regions. Because of the high lateral resoluti on even residual stresses of third order (inhomogeneities of the stress sta te within a grain) can be proved and calculated.